Chendur International Journal of Mathematical Modelling (CIJMM)
Published by Chendur Publishing House
Project Details: Comparison of Various Scan-Chain
PaperID
EIJTEAM-4009
DOI Number
Volume
5
Issue
issue 2
Year
2017
Page No:
12-15
Abstract:
Testing a circuit is one of the
Keywords
Security, Built-in Self-Test, Fu